HItachi S3500N Variable Pressure SEM

    Equipment/facility: Equipment

      Equipments Details

      Description

      The Hitachi S3500N Variable Pressure Scanning Electron Microscope (SEM). Quartz PCI digital imaging, Stage with motor driven X & Y axes, Environmental Secondary Electron Detector (ESED), Absorbed Electron EBIC detector, Robinson Backscattered Electron Detector (BSE), standard Secondary Electron Detector (SED), Infrared ChamberScope, Windows NT Operating System, Emitech K-1150 Cryogenic System, with cryo-prep unit, airlock interface to SEM, sputter coater.

      Fingerprint

      Explore the research areas in which this equipment has been used. These labels are generated based on the related outputs. Together they form a unique fingerprint.