Abstract
We present a detailed study on the operation of a tunneling field-effect transistor (TFET) based on onedimensional broken-gap heterostructure geometry. Using numerical simulations we show that less than 60mV/dec subthreshold swing can be obtained in this device along with MOSFET-like drive-currents. We further demonstrate that the 1D geometry is uniquely suited for this device concept. Our model broken-gap TFET has a minimum swing of ∼20mV/dec along with ∼100x increase in above-threshold current compared to the homojunction geometry.
Original language | English (US) |
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Title of host publication | 2009 International Electron Devices Meeting, IEDM 2009 - Technical Digest |
DOIs | |
State | Published - Dec 1 2009 |
Event | 2009 International Electron Devices Meeting, IEDM 2009 - Baltimore, MD, United States Duration: Dec 7 2009 → Dec 9 2009 |
Other
Other | 2009 International Electron Devices Meeting, IEDM 2009 |
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Country/Territory | United States |
City | Baltimore, MD |
Period | 12/7/09 → 12/9/09 |