TY - JOUR
T1 - A Data Base Driven Automated System for MOS Device Characterization, Parameter Optimization and Modeling
AU - Melstrand, Orlin
AU - O'neill, Ed
AU - Sobelman, Gerald E.
AU - Dokos, Dimitri
PY - 1984/1
Y1 - 1984/1
N2 - An automated system has been developed for use in the characterization and modeling of MOS transistors. The system, consisting of automatic testing, a dynamic data base, and device parameter extraction, has been applied to process characterization and device modeling. The data base handles storage and retrieval of the data. Parameter extraction is based on optimization with constraints.
AB - An automated system has been developed for use in the characterization and modeling of MOS transistors. The system, consisting of automatic testing, a dynamic data base, and device parameter extraction, has been applied to process characterization and device modeling. The data base handles storage and retrieval of the data. Parameter extraction is based on optimization with constraints.
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U2 - 10.1109/TCAD.1984.1270056
DO - 10.1109/TCAD.1984.1270056
M3 - Article
AN - SCOPUS:0021202646
SN - 0278-0070
VL - 3
SP - 47
EP - 51
JO - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
JF - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IS - 1
ER -