An automated system has been developed for use in the characterization and modeling of MOS transistors. The system, consisting of automatic testing, a dynamic data base, and device parameter extraction, has been applied to process characterization and device modeling. The data base handles storage and retrieval of the data. Parameter extraction is based on optimization with constraints.
|Original language||English (US)|
|Number of pages||5|
|Journal||IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems|
|State||Published - Jan 1984|