Abstract
The interfaces between narrow augite exsolution lamellae and enstatite matrix are examined in detail by transmission electron microscopy using weak-beam and direct lattice imaging techniques. Direct observation of matrix planes with a (100) interplanar spacing (18-3 A) and the (200) lamella planes (4·6 Å) at the interfaoe between the two phases reveals steps or ledges usually one atomic plane high every few hundred Angstroms; growth of a lamella apparently involves the motion of ledges parallel to the interface. Terminating (200) lattice fringes, indicating the presence of a dislocation, are observed at each ledge. The dislocations, which are parallel to [010], also have an [001] component that stabilizes the structure by reducing the strain energy of the interface.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1041-1049 |
| Number of pages | 9 |
| Journal | Philosophical Magazine |
| Volume | 29 |
| Issue number | 5 |
| DOIs | |
| State | Published - May 1974 |