A high resolution on-chip beat frequency detection system for measuring BTI, HCI, and TDDB

John Keane; Xiaofei Wang; Devin Persaud; Chris H. Kim

doi:10.1109/ICICDT.2010.5510268

A high resolution on-chip beat frequency detection system for measuring BTI, HCI, and TDDB

John Keane, Xiaofei Wang, Devin Persaud, Chris H. Kim

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We present an on-chip reliability monitor capable of separating the aging effects of Hot Carrier Injection (HCI), Bias Temperature Instability (BTI), and Time Dependent Dielectric Breakdown (TDDB) with high frequency resolution. Sub-μs measurements are controlled by on-chip logic in order to avoid excessive unwanted BTI recovery during stress interruptions. Frequency shift measurement resolution of down to the error floor of 0.07% is achieved during these short interruptions using a beat frequency detection system, and we automate the experiments through a simple digital interface. Measurement results are presented from a 65 nm test chip.

Original language	English (US)
Title of host publication	2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010
Pages	142-145
Number of pages	4
DOIs	https://doi.org/10.1109/ICICDT.2010.5510268
State	Published - Aug 20 2010
Event	2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010 - Grenoble, France Duration: Jun 2 2010 → Jun 4 2010

Publication series

Name	2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010

Other

Other	2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010
Country/Territory	France
City	Grenoble
Period	6/2/10 → 6/4/10

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10.1109/ICICDT.2010.5510268

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Keane, J., Wang, X., Persaud, D., & Kim, C. H. (2010). A high resolution on-chip beat frequency detection system for measuring BTI, HCI, and TDDB. In 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010 (pp. 142-145). Article 5510268 (2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010). https://doi.org/10.1109/ICICDT.2010.5510268

A high resolution on-chip beat frequency detection system for measuring BTI, HCI, and TDDB. / Keane, John; Wang, Xiaofei; Persaud, Devin et al.
2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010. 2010. p. 142-145 5510268 (2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Keane, J, Wang, X, Persaud, D & Kim, CH 2010, A high resolution on-chip beat frequency detection system for measuring BTI, HCI, and TDDB. in 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010., 5510268, 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010, pp. 142-145, 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010, Grenoble, France, 6/2/10. https://doi.org/10.1109/ICICDT.2010.5510268

Keane J, Wang X, Persaud D, Kim CH. A high resolution on-chip beat frequency detection system for measuring BTI, HCI, and TDDB. In 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010. 2010. p. 142-145. 5510268. (2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010). doi: 10.1109/ICICDT.2010.5510268

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A high resolution on-chip beat frequency detection system for measuring BTI, HCI, and TDDB

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