A high resolution on-chip beat frequency detection system for measuring BTI, HCI, and TDDB

John Keane, Xiaofei Wang, Devin Persaud, Chris H. Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present an on-chip reliability monitor capable of separating the aging effects of Hot Carrier Injection (HCI), Bias Temperature Instability (BTI), and Time Dependent Dielectric Breakdown (TDDB) with high frequency resolution. Sub-μs measurements are controlled by on-chip logic in order to avoid excessive unwanted BTI recovery during stress interruptions. Frequency shift measurement resolution of down to the error floor of 0.07% is achieved during these short interruptions using a beat frequency detection system, and we automate the experiments through a simple digital interface. Measurement results are presented from a 65 nm test chip.

Original languageEnglish (US)
Title of host publication2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010
Pages142-145
Number of pages4
DOIs
StatePublished - Aug 20 2010
Event2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010 - Grenoble, France
Duration: Jun 2 2010Jun 4 2010

Publication series

Name2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010

Other

Other2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010
CountryFrance
CityGrenoble
Period6/2/106/4/10

Fingerprint Dive into the research topics of 'A high resolution on-chip beat frequency detection system for measuring BTI, HCI, and TDDB'. Together they form a unique fingerprint.

Cite this