TY - GEN
T1 - A jitter-resilient sampling technique for high-resolution ADCs in wideband RF receivers
AU - Jamali-Zavareh, Shiva
AU - Harjani, Ramesh
PY - 2017/2/2
Y1 - 2017/2/2
N2 - In this paper, we analyze a novel sampling technique that addresses the clock jitter problem in high resolution wideband ADCs. The proposed sampler shapes the jitter-induced error in a manner similar to a ΔΣ ADC, which normally shapes the quantization noise. The clock jitter at the sampler is suppressed by the loop filter, and the impact of feedback pulse jitter is reduced through use of switched-capacitor feedback. As opposed to prior studies, we show that the a ΔΣ sampler suppresses the jitter error by more than 10X even at low OSR. As an example, a 2nd-order ΔΣ sampler increases the SJNR by 22 dB at OSR=5, corresponding to more than 3-bit improvement in the achievable SNR. Analysis indicates that increasing the loop order and/or OSR improves the amount of jitter suppression. In addition, the ΔΣ sampler provides the clock programmable anti-aliasing properties of an integration sampler. The analysis was validated via macro-model simulations in MATLAB and circuit simulation in Cadence.
AB - In this paper, we analyze a novel sampling technique that addresses the clock jitter problem in high resolution wideband ADCs. The proposed sampler shapes the jitter-induced error in a manner similar to a ΔΣ ADC, which normally shapes the quantization noise. The clock jitter at the sampler is suppressed by the loop filter, and the impact of feedback pulse jitter is reduced through use of switched-capacitor feedback. As opposed to prior studies, we show that the a ΔΣ sampler suppresses the jitter error by more than 10X even at low OSR. As an example, a 2nd-order ΔΣ sampler increases the SJNR by 22 dB at OSR=5, corresponding to more than 3-bit improvement in the achievable SNR. Analysis indicates that increasing the loop order and/or OSR improves the amount of jitter suppression. In addition, the ΔΣ sampler provides the clock programmable anti-aliasing properties of an integration sampler. The analysis was validated via macro-model simulations in MATLAB and circuit simulation in Cadence.
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U2 - 10.1109/ICECS.2016.7841174
DO - 10.1109/ICECS.2016.7841174
M3 - Conference contribution
AN - SCOPUS:85015319067
T3 - 2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016
SP - 229
EP - 232
BT - 2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 23rd IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016
Y2 - 11 December 2016 through 14 December 2016
ER -