TY - GEN
T1 - A method to evaluate the skew by data dependent gate loading in VLSI system
AU - Yanfeng, Jiang
AU - Xiaobo, Zhang
AU - Bing, Yang
PY - 2009
Y1 - 2009
N2 - In this paper, the skew by data dependent gate loading has been analysized. A method based on the concept of MOS parametric capacitance has been proposed. According to different data dependent of the MOS transistor, including transient channel charge and Miller effects, the values of capacitance in different data loadings have been extracted. Two clock tree routes have been analyzed by using the gate loading effect. Results revealed that the simulation result including the gate loading approaches to the actual ones closely.
AB - In this paper, the skew by data dependent gate loading has been analysized. A method based on the concept of MOS parametric capacitance has been proposed. According to different data dependent of the MOS transistor, including transient channel charge and Miller effects, the values of capacitance in different data loadings have been extracted. Two clock tree routes have been analyzed by using the gate loading effect. Results revealed that the simulation result including the gate loading approaches to the actual ones closely.
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M3 - Conference contribution
AN - SCOPUS:71449112459
SN - 9788995605691
T3 - Proceedings of 2009 7th Asian Control Conference, ASCC 2009
SP - 547
EP - 550
BT - Proceedings of 2009 7th Asian Control Conference, ASCC 2009
T2 - 2009 7th Asian Control Conference, ASCC 2009
Y2 - 27 August 2009 through 29 August 2009
ER -