TY - GEN
T1 - A Model for Impact Dynamics and its Application to Frequency Analysis of Tapping-Mode Atomic Force Microscopes
AU - Materassi, D.
AU - Basso, M.
AU - Genesio, R.
PY - 2003
Y1 - 2003
N2 - The problem of two-body impact dynamics is considered providing a general class of models based on hysteresis functions. The structure of the model and its flexibility allows for a direct application of harmonic balance techniques for the analysis of periodic impacts when the forces involved are either repulsive, repulsive-attractive and dissipative. An application to the oscillation analysis of a tapping-mode Atomic Force Microscope (AFM) provides useful analytical results which give a qualitative explanation of a number of known experimental phenomena.
AB - The problem of two-body impact dynamics is considered providing a general class of models based on hysteresis functions. The structure of the model and its flexibility allows for a direct application of harmonic balance techniques for the analysis of periodic impacts when the forces involved are either repulsive, repulsive-attractive and dissipative. An application to the oscillation analysis of a tapping-mode Atomic Force Microscope (AFM) provides useful analytical results which give a qualitative explanation of a number of known experimental phenomena.
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U2 - 10.1109/CDC.2003.1272277
DO - 10.1109/CDC.2003.1272277
M3 - Conference contribution
AN - SCOPUS:1542288194
SN - 0780379241
T3 - Proceedings of the IEEE Conference on Decision and Control
SP - 6218
EP - 6223
BT - Proceedings of the IEEE Conference on Decision and Control
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 42nd IEEE Conference on Decision and Control
Y2 - 9 December 2003 through 12 December 2003
ER -