A phase analysis method for ferromagnetic resonance characterization of magnetic nanowires

Yali Zhang; Brandon Garcia; Joseph Um; Bethanie Stadler; Rhonda Franklin

doi:10.1109/IMS30576.2020.9224042

A phase analysis method for ferromagnetic resonance characterization of magnetic nanowires

Yali Zhang, Brandon Garcia, Joseph Um, Bethanie Stadler, Rhonda Franklin

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

This paper presents a phase analysis method (PAM) in DC field domain to detect ferromagnetic resonance (FMR) properties of magnetic nanowires. The S-parameter phase is extracted, and a derivative is applied to show FMR frequencies and magnetic moment direction. A comparison between the magnitude method and PAM is made. PAM provides advantages in determining FMR frequencies for overlapped linewidths. For a two-port coplanar waveguide (CPW) test circuit, the sample placement effect is studied. The phase derivative results show consistent FMR frequencies at DC field of 0.87T for different sample placements. Similarly, three different types of nanowires, iron (Fe), cobalt (Co) and nickel (Ni) are measured and can be easily distinguished. Finally, on a one-port shorted CPW test circuit, the length effect is studied. Two nanowire chips from one sample are diced with the same width but different lengths. When compared, their FMR frequencies possess differences of 0.06T using PAM.

Original language	English (US)
Title of host publication	IMS 2020 - 2020 IEEE/MTT-S International Microwave Symposium
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	968-971
Number of pages	4
ISBN (Electronic)	9781728168159
DOIs	https://doi.org/10.1109/IMS30576.2020.9224042
State	Published - Aug 2020
Event	2020 IEEE/MTT-S International Microwave Symposium, IMS 2020 - Virtual, Los Angeles, United States Duration: Aug 4 2020 → Aug 6 2020

Publication series

Name	IEEE MTT-S International Microwave Symposium Digest
Volume	2020-August
ISSN (Print)	0149-645X

Conference

Conference	2020 IEEE/MTT-S International Microwave Symposium, IMS 2020
Country/Territory	United States
City	Virtual, Los Angeles
Period	8/4/20 → 8/6/20

Bibliographical note

Funding Information:
ACKNOWLEDGMENT This work was supported by the National Science Foundation (NSF) Award (ECCS #1509543) with portions conducted in the Minnesota Nano Center, an NSF National Nano Coordinated Infrastructure Network (NNCI -1542202).

Publisher Copyright:
© 2020 IEEE.

Keywords

Coplanar waveguide
Ferromagnetic resonance
Nanowires
Phase analysis
Scattering parameters

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10.1109/IMS30576.2020.9224042

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Zhang, Y., Garcia, B., Um, J., Stadler, B., & Franklin, R. (2020). A phase analysis method for ferromagnetic resonance characterization of magnetic nanowires. In IMS 2020 - 2020 IEEE/MTT-S International Microwave Symposium (pp. 968-971). Article 9224042 (IEEE MTT-S International Microwave Symposium Digest; Vol. 2020-August). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IMS30576.2020.9224042

A phase analysis method for ferromagnetic resonance characterization of magnetic nanowires. / Zhang, Yali; Garcia, Brandon; Um, Joseph et al.
IMS 2020 - 2020 IEEE/MTT-S International Microwave Symposium. Institute of Electrical and Electronics Engineers Inc., 2020. p. 968-971 9224042 (IEEE MTT-S International Microwave Symposium Digest; Vol. 2020-August).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Zhang, Y, Garcia, B, Um, J, Stadler, B & Franklin, R 2020, A phase analysis method for ferromagnetic resonance characterization of magnetic nanowires. in IMS 2020 - 2020 IEEE/MTT-S International Microwave Symposium., 9224042, IEEE MTT-S International Microwave Symposium Digest, vol. 2020-August, Institute of Electrical and Electronics Engineers Inc., pp. 968-971, 2020 IEEE/MTT-S International Microwave Symposium, IMS 2020, Virtual, Los Angeles, United States, 8/4/20. https://doi.org/10.1109/IMS30576.2020.9224042

Zhang Y, Garcia B, Um J, Stadler B , Franklin R. A phase analysis method for ferromagnetic resonance characterization of magnetic nanowires. In IMS 2020 - 2020 IEEE/MTT-S International Microwave Symposium. Institute of Electrical and Electronics Engineers Inc. 2020. p. 968-971. 9224042. (IEEE MTT-S International Microwave Symposium Digest). doi: 10.1109/IMS30576.2020.9224042

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abstract = "This paper presents a phase analysis method (PAM) in DC field domain to detect ferromagnetic resonance (FMR) properties of magnetic nanowires. The S-parameter phase is extracted, and a derivative is applied to show FMR frequencies and magnetic moment direction. A comparison between the magnitude method and PAM is made. PAM provides advantages in determining FMR frequencies for overlapped linewidths. For a two-port coplanar waveguide (CPW) test circuit, the sample placement effect is studied. The phase derivative results show consistent FMR frequencies at DC field of 0.87T for different sample placements. Similarly, three different types of nanowires, iron (Fe), cobalt (Co) and nickel (Ni) are measured and can be easily distinguished. Finally, on a one-port shorted CPW test circuit, the length effect is studied. Two nanowire chips from one sample are diced with the same width but different lengths. When compared, their FMR frequencies possess differences of 0.06T using PAM.",

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N2 - This paper presents a phase analysis method (PAM) in DC field domain to detect ferromagnetic resonance (FMR) properties of magnetic nanowires. The S-parameter phase is extracted, and a derivative is applied to show FMR frequencies and magnetic moment direction. A comparison between the magnitude method and PAM is made. PAM provides advantages in determining FMR frequencies for overlapped linewidths. For a two-port coplanar waveguide (CPW) test circuit, the sample placement effect is studied. The phase derivative results show consistent FMR frequencies at DC field of 0.87T for different sample placements. Similarly, three different types of nanowires, iron (Fe), cobalt (Co) and nickel (Ni) are measured and can be easily distinguished. Finally, on a one-port shorted CPW test circuit, the length effect is studied. Two nanowire chips from one sample are diced with the same width but different lengths. When compared, their FMR frequencies possess differences of 0.06T using PAM.

AB - This paper presents a phase analysis method (PAM) in DC field domain to detect ferromagnetic resonance (FMR) properties of magnetic nanowires. The S-parameter phase is extracted, and a derivative is applied to show FMR frequencies and magnetic moment direction. A comparison between the magnitude method and PAM is made. PAM provides advantages in determining FMR frequencies for overlapped linewidths. For a two-port coplanar waveguide (CPW) test circuit, the sample placement effect is studied. The phase derivative results show consistent FMR frequencies at DC field of 0.87T for different sample placements. Similarly, three different types of nanowires, iron (Fe), cobalt (Co) and nickel (Ni) are measured and can be easily distinguished. Finally, on a one-port shorted CPW test circuit, the length effect is studied. Two nanowire chips from one sample are diced with the same width but different lengths. When compared, their FMR frequencies possess differences of 0.06T using PAM.

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A phase analysis method for ferromagnetic resonance characterization of magnetic nanowires

Abstract

Publication series

Conference

Bibliographical note

Keywords

Access

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