TY - GEN
T1 - A Physical Unclonable Function based on Capacitor Mismatch in a Charge-Redistribution SAR-ADC
AU - Tang, Qianying
AU - Choi, Won Ho
AU - Everson, Luke
AU - Parhi, Keshab K.
AU - Kim, Chris H.
PY - 2018/4/26
Y1 - 2018/4/26
N2 - A Physical Unclonable Function (PUF) using capacitor mismatch in a standard successive approximation register analog-to-digital converter (SAR-ADC) as the entropy source is demonstrated in 65nm CMOS. SAR-ADCs are readily available in many system-on-chips, making the hardware overhead of the proposed PUF almost negligible. The inherent process variation of metal-oxide-metal (MOM) capacitors is harnessed through a charge redistribution operation which is sampled by the voltage comparator. To enhance the stability of the PUF output, soft response generation and dynamic thresholding techniques were adopted. Finally, we verify that performing the enrollment operation at a lower operating voltage can ensure that PUF responses are stable at the nominal supply voltage used during authentication.
AB - A Physical Unclonable Function (PUF) using capacitor mismatch in a standard successive approximation register analog-to-digital converter (SAR-ADC) as the entropy source is demonstrated in 65nm CMOS. SAR-ADCs are readily available in many system-on-chips, making the hardware overhead of the proposed PUF almost negligible. The inherent process variation of metal-oxide-metal (MOM) capacitors is harnessed through a charge redistribution operation which is sampled by the voltage comparator. To enhance the stability of the PUF output, soft response generation and dynamic thresholding techniques were adopted. Finally, we verify that performing the enrollment operation at a lower operating voltage can ensure that PUF responses are stable at the nominal supply voltage used during authentication.
KW - Physical Unclonable Function (PUF)
KW - Successive Approximation (SAR) ADC
KW - capacitance variation
KW - charge redistribution
UR - http://www.scopus.com/inward/record.url?scp=85057128092&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85057128092&partnerID=8YFLogxK
U2 - 10.1109/ISCAS.2018.8351601
DO - 10.1109/ISCAS.2018.8351601
M3 - Conference contribution
AN - SCOPUS:85057128092
T3 - Proceedings - IEEE International Symposium on Circuits and Systems
BT - 2018 IEEE International Symposium on Circuits and Systems, ISCAS 2018 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2018 IEEE International Symposium on Circuits and Systems, ISCAS 2018
Y2 - 27 May 2018 through 30 May 2018
ER -