A revolving reference odometer circuit for BTI-induced frequency fluctuation measurements under fast DVFS transients

Saroj Satapathy; Won Ho Choi; Xiaofei Wang; Chris H. Kim

doi:10.1109/IRPS.2015.7112757

A revolving reference odometer circuit for BTI-induced frequency fluctuation measurements under fast DVFS transients

Saroj Satapathy, Won Ho Choi, Xiaofei Wang, Chris H. Kim

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

10 Scopus citations

Abstract

Bias Temperature Instability (BTI) under sub-microsecond DVFS transients manifests as instantaneous frequency degradation and recovery that has been predicted in past literature but has never been experimentally verified due to difficulty in obtaining high quality data. This work demonstrates a new odometer circuit specifically designed to measure the aforementioned effect. The basic idea is to use multiple fresh reference ring oscillators (ROSCs), which alternately take measurements to minimize any degradation in the reference ROSC's frequency and thereby enhancing the sampling time as well as the sampling resolution. Measurements from a 65nm test chip show excellent were taken under different voltage supply, temperature, stress time duration, and supply ramp time.

Original language	English (US)
Title of host publication	2015 IEEE International Reliability Physics Symposium, IRPS 2015
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	6A31-6A35
ISBN (Electronic)	9781467373623
DOIs	https://doi.org/10.1109/IRPS.2015.7112757
State	Published - May 26 2015
Event	IEEE International Reliability Physics Symposium, IRPS 2015 - Monterey, United States Duration: Apr 19 2015 → Apr 23 2015

Publication series

Name	IEEE International Reliability Physics Symposium Proceedings
Volume	2015-May
ISSN (Print)	1541-7026

Other

Other	IEEE International Reliability Physics Symposium, IRPS 2015
Country/Territory	United States
City	Monterey
Period	4/19/15 → 4/23/15

Bibliographical note

Publisher Copyright:
© 2015 IEEE.

Keywords

BTI
fast DVFS
guard band
odometer
on-chip monitor
recovery
revolving reference
stress

Access

10.1109/IRPS.2015.7112757

OpenUrl availability

Full text

Cite this

Satapathy, S., Choi, W. H., Wang, X., & Kim, C. H. (2015). A revolving reference odometer circuit for BTI-induced frequency fluctuation measurements under fast DVFS transients. In 2015 IEEE International Reliability Physics Symposium, IRPS 2015 (pp. 6A31-6A35). Article 7112757 (IEEE International Reliability Physics Symposium Proceedings; Vol. 2015-May). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IRPS.2015.7112757

A revolving reference odometer circuit for BTI-induced frequency fluctuation measurements under fast DVFS transients. / Satapathy, Saroj; Choi, Won Ho; Wang, Xiaofei et al.
2015 IEEE International Reliability Physics Symposium, IRPS 2015. Institute of Electrical and Electronics Engineers Inc., 2015. p. 6A31-6A35 7112757 (IEEE International Reliability Physics Symposium Proceedings; Vol. 2015-May).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Satapathy, S, Choi, WH, Wang, X & Kim, CH 2015, A revolving reference odometer circuit for BTI-induced frequency fluctuation measurements under fast DVFS transients. in 2015 IEEE International Reliability Physics Symposium, IRPS 2015., 7112757, IEEE International Reliability Physics Symposium Proceedings, vol. 2015-May, Institute of Electrical and Electronics Engineers Inc., pp. 6A31-6A35, IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, United States, 4/19/15. https://doi.org/10.1109/IRPS.2015.7112757

Satapathy S, Choi WH, Wang X, Kim CH. A revolving reference odometer circuit for BTI-induced frequency fluctuation measurements under fast DVFS transients. In 2015 IEEE International Reliability Physics Symposium, IRPS 2015. Institute of Electrical and Electronics Engineers Inc. 2015. p. 6A31-6A35. 7112757. (IEEE International Reliability Physics Symposium Proceedings). doi: 10.1109/IRPS.2015.7112757

Satapathy, Saroj ; Choi, Won Ho ; Wang, Xiaofei et al. / A revolving reference odometer circuit for BTI-induced frequency fluctuation measurements under fast DVFS transients. 2015 IEEE International Reliability Physics Symposium, IRPS 2015. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 6A31-6A35 (IEEE International Reliability Physics Symposium Proceedings).

@inproceedings{50bf8a4ad51a4f4e8fa534b058ebcf83,

title = "A revolving reference odometer circuit for BTI-induced frequency fluctuation measurements under fast DVFS transients",

abstract = "Bias Temperature Instability (BTI) under sub-microsecond DVFS transients manifests as instantaneous frequency degradation and recovery that has been predicted in past literature but has never been experimentally verified due to difficulty in obtaining high quality data. This work demonstrates a new odometer circuit specifically designed to measure the aforementioned effect. The basic idea is to use multiple fresh reference ring oscillators (ROSCs), which alternately take measurements to minimize any degradation in the reference ROSC's frequency and thereby enhancing the sampling time as well as the sampling resolution. Measurements from a 65nm test chip show excellent were taken under different voltage supply, temperature, stress time duration, and supply ramp time.",

keywords = "BTI, fast DVFS, guard band, odometer, on-chip monitor, recovery, revolving reference, stress",

author = "Saroj Satapathy and Choi, {Won Ho} and Xiaofei Wang and Kim, {Chris H.}",

note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; IEEE International Reliability Physics Symposium, IRPS 2015 ; Conference date: 19-04-2015 Through 23-04-2015",

year = "2015",

month = may,

day = "26",

doi = "10.1109/IRPS.2015.7112757",

language = "English (US)",

series = "IEEE International Reliability Physics Symposium Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "6A31--6A35",

booktitle = "2015 IEEE International Reliability Physics Symposium, IRPS 2015",

}

TY - GEN

T1 - A revolving reference odometer circuit for BTI-induced frequency fluctuation measurements under fast DVFS transients

AU - Satapathy, Saroj

AU - Choi, Won Ho

AU - Wang, Xiaofei

AU - Kim, Chris H.

PY - 2015/5/26

Y1 - 2015/5/26

N2 - Bias Temperature Instability (BTI) under sub-microsecond DVFS transients manifests as instantaneous frequency degradation and recovery that has been predicted in past literature but has never been experimentally verified due to difficulty in obtaining high quality data. This work demonstrates a new odometer circuit specifically designed to measure the aforementioned effect. The basic idea is to use multiple fresh reference ring oscillators (ROSCs), which alternately take measurements to minimize any degradation in the reference ROSC's frequency and thereby enhancing the sampling time as well as the sampling resolution. Measurements from a 65nm test chip show excellent were taken under different voltage supply, temperature, stress time duration, and supply ramp time.

AB - Bias Temperature Instability (BTI) under sub-microsecond DVFS transients manifests as instantaneous frequency degradation and recovery that has been predicted in past literature but has never been experimentally verified due to difficulty in obtaining high quality data. This work demonstrates a new odometer circuit specifically designed to measure the aforementioned effect. The basic idea is to use multiple fresh reference ring oscillators (ROSCs), which alternately take measurements to minimize any degradation in the reference ROSC's frequency and thereby enhancing the sampling time as well as the sampling resolution. Measurements from a 65nm test chip show excellent were taken under different voltage supply, temperature, stress time duration, and supply ramp time.

KW - BTI

KW - fast DVFS

KW - guard band

KW - odometer

KW - on-chip monitor

KW - recovery

KW - revolving reference

KW - stress

UR - http://www.scopus.com/inward/record.url?scp=84942887015&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84942887015&partnerID=8YFLogxK

U2 - 10.1109/IRPS.2015.7112757

DO - 10.1109/IRPS.2015.7112757

M3 - Conference contribution

AN - SCOPUS:84942887015

T3 - IEEE International Reliability Physics Symposium Proceedings

SP - 6A31-6A35

BT - 2015 IEEE International Reliability Physics Symposium, IRPS 2015

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - IEEE International Reliability Physics Symposium, IRPS 2015

Y2 - 19 April 2015 through 23 April 2015

ER -

A revolving reference odometer circuit for BTI-induced frequency fluctuation measurements under fast DVFS transients

Abstract

Publication series

Other

Bibliographical note

Keywords

Access

OpenUrl availability

Other files and links

Fingerprint

Cite this