A revolving reference odometer circuit for BTI-induced frequency fluctuation measurements under fast DVFS transients

Saroj Satapathy, Won Ho Choi, Xiaofei Wang, Chris H. Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Scopus citations

Abstract

Bias Temperature Instability (BTI) under sub-microsecond DVFS transients manifests as instantaneous frequency degradation and recovery that has been predicted in past literature but has never been experimentally verified due to difficulty in obtaining high quality data. This work demonstrates a new odometer circuit specifically designed to measure the aforementioned effect. The basic idea is to use multiple fresh reference ring oscillators (ROSCs), which alternately take measurements to minimize any degradation in the reference ROSC's frequency and thereby enhancing the sampling time as well as the sampling resolution. Measurements from a 65nm test chip show excellent were taken under different voltage supply, temperature, stress time duration, and supply ramp time.

Original languageEnglish (US)
Title of host publication2015 IEEE International Reliability Physics Symposium, IRPS 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages6A31-6A35
Volume2015-May
ISBN (Electronic)9781467373623
DOIs
StatePublished - Jan 1 2015
EventIEEE International Reliability Physics Symposium, IRPS 2015 - Monterey, United States
Duration: Apr 19 2015Apr 23 2015

Other

OtherIEEE International Reliability Physics Symposium, IRPS 2015
CountryUnited States
CityMonterey
Period4/19/154/23/15

Keywords

  • BTI
  • fast DVFS
  • guard band
  • odometer
  • on-chip monitor
  • recovery
  • revolving reference
  • stress

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