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A study of the oxidation behavior and the postannealing effect in a graded SiGe/Si heterostructure
Y. S. Lim, J. S. Jeong, J. Y. Lee, H. S. Kim, H. K. Shon, H. K. Kim, D. W. Moon
Research output: Contribution to journal › Article › peer-review
8
Scopus
citations