A Technique for the Study of Gunn Devices at 9.1 GHz Using a Scanning Electron Microscope

A. Gopinath, M. S. Hill

Research output: Contribution to journalArticlepeer-review

15 Scopus citations

Abstract

A scanning electron microscope operating in the stroboscopic mode has been used to observe dynamic voltage distributions in Gunn devices oscillating at 9.1 GHz and hence to examine domain motion. The technique used in the experiment is outlined and sample results presented.

Original languageEnglish (US)
Pages (from-to)610-612
Number of pages3
JournalIEEE Transactions on Electron Devices
Volume20
Issue number7
DOIs
StatePublished - Jul 1973

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