A Technique for the Study of Gunn Devices at 9.1 GHz Using a Scanning Electron Microscope

A. Gopinath; M. S. Hill

doi:10.1109/T-ED.1973.17711

A Technique for the Study of Gunn Devices at 9.1 GHz Using a Scanning Electron Microscope

A. Gopinath, M. S. Hill

Electrical and Computer Engineering

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Abstract

A scanning electron microscope operating in the stroboscopic mode has been used to observe dynamic voltage distributions in Gunn devices oscillating at 9.1 GHz and hence to examine domain motion. The technique used in the experiment is outlined and sample results presented.

Original language	English (US)
Pages (from-to)	610-612
Number of pages	3
Journal	IEEE Transactions on Electron Devices
Volume	20
Issue number	7
DOIs	https://doi.org/10.1109/T-ED.1973.17711
State	Published - Jul 1973

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@article{2e3de18b501f4327ad62ece4fa027df9,

title = "A Technique for the Study of Gunn Devices at 9.1 GHz Using a Scanning Electron Microscope",

abstract = "A scanning electron microscope operating in the stroboscopic mode has been used to observe dynamic voltage distributions in Gunn devices oscillating at 9.1 GHz and hence to examine domain motion. The technique used in the experiment is outlined and sample results presented.",

author = "A. Gopinath and Hill, {M. S.}",

year = "1973",

month = jul,

doi = "10.1109/T-ED.1973.17711",

language = "English (US)",

volume = "20",

pages = "610--612",

journal = "IEEE Transactions on Electron Devices",

issn = "0018-9383",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "7",

}

TY - JOUR

T1 - A Technique for the Study of Gunn Devices at 9.1 GHz Using a Scanning Electron Microscope

AU - Gopinath, A.

AU - Hill, M. S.

PY - 1973/7

Y1 - 1973/7

N2 - A scanning electron microscope operating in the stroboscopic mode has been used to observe dynamic voltage distributions in Gunn devices oscillating at 9.1 GHz and hence to examine domain motion. The technique used in the experiment is outlined and sample results presented.

AB - A scanning electron microscope operating in the stroboscopic mode has been used to observe dynamic voltage distributions in Gunn devices oscillating at 9.1 GHz and hence to examine domain motion. The technique used in the experiment is outlined and sample results presented.

UR - http://www.scopus.com/inward/record.url?scp=0015648914&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0015648914&partnerID=8YFLogxK

U2 - 10.1109/T-ED.1973.17711

DO - 10.1109/T-ED.1973.17711

M3 - Article

AN - SCOPUS:0015648914

SN - 0018-9383

VL - 20

SP - 610

EP - 612

JO - IEEE Transactions on Electron Devices

JF - IEEE Transactions on Electron Devices

IS - 7

ER -

A Technique for the Study of Gunn Devices at 9.1 GHz Using a Scanning Electron Microscope

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