A transmission electron microscopy study of annealed Nb-Ge thin films

Corwin P. Umbach; Louis E. Toth; Allen M. Goldman

doi:10.1016/0022-5088(80)90289-1

A transmission electron microscopy study of annealed Nb-Ge thin films

Corwin P. Umbach, Louis E. Toth, Allen M. Goldman

Physics and Astronomy (Twin Cities)

Research output: Contribution to journal › Article › peer-review

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Abstract

Microcrystalline sputter-deposited niobium-germanium films were annealed inside a transmission electron microscope and the microcrystalline-to-crystalline phase transformation was studied. From selected area electron diffraction patterns it was found that, in addition to the A15 Nb₃Ge and other phases expected, two previously unreported phases were present in the crystalline films. These were identified as being analogous to the tetragonal Ti₃P and cubic Cu₃Au phases of the niobium-silicon system.

Original language	English (US)
Pages (from-to)	319-326
Number of pages	8
Journal	Journal of The Less-Common Metals
Volume	69
Issue number	2
DOIs	https://doi.org/10.1016/0022-5088(80)90289-1
State	Published - Feb 1980

Bibliographical note

Funding Information:
This work was supported in part by the National Science Foundation under grant DMR 78-08513 and by the Graduate School of the University of Minnesota.

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@article{81e56b04cc9f497cb4de5e223594d27b,

title = "A transmission electron microscopy study of annealed Nb-Ge thin films",

abstract = "Microcrystalline sputter-deposited niobium-germanium films were annealed inside a transmission electron microscope and the microcrystalline-to-crystalline phase transformation was studied. From selected area electron diffraction patterns it was found that, in addition to the A15 Nb3Ge and other phases expected, two previously unreported phases were present in the crystalline films. These were identified as being analogous to the tetragonal Ti3P and cubic Cu3Au phases of the niobium-silicon system.",

author = "Umbach, {Corwin P.} and Toth, {Louis E.} and Goldman, {Allen M.}",

note = "Funding Information: This work was supported in part by the National Science Foundation under grant DMR 78-08513 and by the Graduate School of the University of Minnesota.",

year = "1980",

month = feb,

doi = "10.1016/0022-5088(80)90289-1",

language = "English (US)",

volume = "69",

pages = "319--326",

journal = "Journal of The Less-Common Metals",

issn = "0022-5088",

publisher = "Elsevier BV",

number = "2",

}

TY - JOUR

T1 - A transmission electron microscopy study of annealed Nb-Ge thin films

AU - Umbach, Corwin P.

AU - Toth, Louis E.

AU - Goldman, Allen M.

N1 - Funding Information: This work was supported in part by the National Science Foundation under grant DMR 78-08513 and by the Graduate School of the University of Minnesota.

PY - 1980/2

Y1 - 1980/2

N2 - Microcrystalline sputter-deposited niobium-germanium films were annealed inside a transmission electron microscope and the microcrystalline-to-crystalline phase transformation was studied. From selected area electron diffraction patterns it was found that, in addition to the A15 Nb3Ge and other phases expected, two previously unreported phases were present in the crystalline films. These were identified as being analogous to the tetragonal Ti3P and cubic Cu3Au phases of the niobium-silicon system.

AB - Microcrystalline sputter-deposited niobium-germanium films were annealed inside a transmission electron microscope and the microcrystalline-to-crystalline phase transformation was studied. From selected area electron diffraction patterns it was found that, in addition to the A15 Nb3Ge and other phases expected, two previously unreported phases were present in the crystalline films. These were identified as being analogous to the tetragonal Ti3P and cubic Cu3Au phases of the niobium-silicon system.

UR - http://www.scopus.com/inward/record.url?scp=0018984732&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0018984732&partnerID=8YFLogxK

U2 - 10.1016/0022-5088(80)90289-1

DO - 10.1016/0022-5088(80)90289-1

M3 - Article

AN - SCOPUS:0018984732

SN - 0022-5088

VL - 69

SP - 319

EP - 326

JO - Journal of The Less-Common Metals

JF - Journal of The Less-Common Metals

IS - 2

ER -

A transmission electron microscopy study of annealed Nb-Ge thin films

Abstract

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