A universal calibration curve for the TSI aerodynamic particle sizer

Chuen Jinn Tsai, Sheng Chieh Chen, Cheng Hsiung Huang, Da Ren Chen

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

A universal calibration curve for the accurate determination of particle aerodynamic diameter by the TSI APS (TSI, Inc., St. Paul, MN, USA) operating at various temperature, pressure, particle, and gas properties is proposed. The previous dimensionless APS response function proposed by Chen et al. (1985) uses the Stokes number as the governing parameter and is valid in the Stokesian regime only. In the non-Stokesian regime, an additional non-Stokesian correction factor is needed to correct for the indicated aerodynamic diameters of the APS. The universal curve in the present study is based on the relationship between V*p and Stm, p where V*p = V p/Vg and Vpis particle velocity, Vg is gas velocity at the nozzle exit, and Stm is modified Stokes number. Stm incorporates the non-Stokesian effect and is defined as 24St/(Re*C D), where Re is the flow Reynolds number and CD is the particle drag coefficient. We find that the new calibration curve can predict the particle aerodynamic diameter accurately within 6% of error under different operating conditions and particle/gas properties from the referenced condition without the need to introduce additional correction factors.

Original languageEnglish (US)
Pages (from-to)467-474
Number of pages8
JournalAerosol Science and Technology
Volume38
Issue number5
DOIs
StatePublished - May 2004
Externally publishedYes

Bibliographical note

Funding Information:
Received 1 July 2003; accepted 18 March 2004. The authors would like to thank Dr. D. J. Rader and Dr. B. T. Chen for providing the original data of their experiments. Financial support of this work is provided by Taiwan NSC 89-2211-E-009-064. Address correspondence to Chuen-Jinn Tsai, Institute of Environmental Engineering, National Chiao Tung University, No. 75 Poai Street, Hsin Chu, 300 Taiwan. E-mail: cjtsai@mail.nctu.edu.tw

Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.

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