TY - GEN
T1 - Accounting for inherent circuit resilience and process variations in analyzing gate oxide reliability
AU - Fang, Jianxin
AU - Sapatnekar, Sachin S
PY - 2011
Y1 - 2011
N2 - Gate oxide breakdown is a major cause of reliability failures in future nanometer-scale CMOS designs. This paper develops an analysis technique that can predict the probability of a functional failure in a large digital circuit due to this phenomenon. Novel features of the method include its ability to account for the inherent resilience in a circuit to a breakdown event, while simultaneously considering the impact of process variations. Based on standard process variation models, at a specified time instant, this procedure determines the circuit failure probability as a lognormal distribution. Experimental results demonstrate this approach is accurate compared with Monte Carlo simulation, and gives 4.7-5.9x better lifetime prediction over existing methods that are based on pessimistic area-scaling models.
AB - Gate oxide breakdown is a major cause of reliability failures in future nanometer-scale CMOS designs. This paper develops an analysis technique that can predict the probability of a functional failure in a large digital circuit due to this phenomenon. Novel features of the method include its ability to account for the inherent resilience in a circuit to a breakdown event, while simultaneously considering the impact of process variations. Based on standard process variation models, at a specified time instant, this procedure determines the circuit failure probability as a lognormal distribution. Experimental results demonstrate this approach is accurate compared with Monte Carlo simulation, and gives 4.7-5.9x better lifetime prediction over existing methods that are based on pessimistic area-scaling models.
UR - http://www.scopus.com/inward/record.url?scp=79952924280&partnerID=8YFLogxK
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U2 - 10.1109/ASPDAC.2011.5722275
DO - 10.1109/ASPDAC.2011.5722275
M3 - Conference contribution
AN - SCOPUS:79952924280
SN - 9781424475155
T3 - Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
SP - 689
EP - 694
BT - 2011 16th Asia and South Pacific Design Automation Conference, ASP-DAC 2011
T2 - 2011 16th Asia and South Pacific Design Automation Conference, ASP-DAC 2011
Y2 - 25 January 2011 through 28 January 2011
ER -