Adhesion of tungsten fine lines of SiO2 by micro-wedge scratching

M. P. de Bore, H. Huang, J. C. Nelson, F. Wang, William W Gerberich

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Fingerprint

Dive into the research topics of 'Adhesion of tungsten fine lines of SiO2 by micro-wedge scratching'. Together they form a unique fingerprint.

Physics & Astronomy

Engineering & Materials Science

Chemical Compounds