TY - JOUR
T1 - AFM imaging - Reliable or not?
AU - Salapaka, Srinivasa M.
AU - Ramamoorthy, Aditya
AU - Salapaka, Murti V.
PY - 2013
Y1 - 2013
N2 - Researchers are engaged in studies in the fields of device redesign and the development of new modes of operation for atomic force microscopy (AFM) to increase the reliability of its images. There has been an increase in system theoretic analysis and design methods, which provide a systematic study of underlying principles and fundamental limitations of AFM, while developing control designs that improve imaging resolution, bandwidth, and reliability of atomic force microscopes. There is an urgent need for approaches that eliminate spurious effects from AFM operation, provide fidelity measures on images that are real-time implementable, and are easy to interpret. Initial steps need to be taken for developing a framework for how control and information theoretic concepts can be used to reduce spuriousness in AFM-based imaging and provide quality measures on AFM images.
AB - Researchers are engaged in studies in the fields of device redesign and the development of new modes of operation for atomic force microscopy (AFM) to increase the reliability of its images. There has been an increase in system theoretic analysis and design methods, which provide a systematic study of underlying principles and fundamental limitations of AFM, while developing control designs that improve imaging resolution, bandwidth, and reliability of atomic force microscopes. There is an urgent need for approaches that eliminate spurious effects from AFM operation, provide fidelity measures on images that are real-time implementable, and are easy to interpret. Initial steps need to be taken for developing a framework for how control and information theoretic concepts can be used to reduce spuriousness in AFM-based imaging and provide quality measures on AFM images.
UR - http://www.scopus.com/inward/record.url?scp=84888418762&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84888418762&partnerID=8YFLogxK
U2 - 10.1109/MCS.2013.2279475
DO - 10.1109/MCS.2013.2279475
M3 - Article
AN - SCOPUS:84888418762
SN - 1066-033X
VL - 33
SP - 106
EP - 118
JO - IEEE Control Systems
JF - IEEE Control Systems
IS - 6
M1 - 6615632
ER -