Aging of Current DACs and its Impact in Equalizer Circuits

Tonmoy Dhar, Jitesh Poojary, Ramesh Harjani, Sachin S. Sapatnekar

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper illustrates the impact of temporal degradations due to aging on current digital-to-analog converters (IDACs) within the context of a feed-forward equalizer (FFE) that is used in high-speed links. Aging causes mismatch in the current mirror, a matching-critical building block of IDACs, which degrades IDAC performance. The work analyzes and models the effect of mismatch over IDAC performance metrics and demonstrates how this affects FFE behavior. Finally, a novel scheme for FFE recalibration to recover from this degradation is presented.

Original languageEnglish (US)
Title of host publication2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728168937
DOIs
StatePublished - Mar 2021
Event2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Virtual, Monterey, United States
Duration: Mar 21 2021Mar 24 2021

Publication series

NameIEEE International Reliability Physics Symposium Proceedings
Volume2021-March
ISSN (Print)1541-7026

Conference

Conference2021 IEEE International Reliability Physics Symposium, IRPS 2021
Country/TerritoryUnited States
CityVirtual, Monterey
Period3/21/213/24/21

Bibliographical note

Publisher Copyright:
© 2021 IEEE.

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