Abstract
A 900 MHz CMOS BFSK transceiver is used as a test vehicle to evaluate the impact of copper interconnect on CMOS RF circuit performance. The RF front-end contains spiral inductors and fractal capacitors, whose parasitics degrade the receiver sensitivity. It is shown that spiral inductor quality factors (Qs) are on average 70% higher when copper interconnect is used in place of aluminum, while capacitor Qs are also improved significantly. As a result, the front-end receiver gain is increased by nearly 4 dB and the receiver noise figure is reduced by more than 1 dB when copper is used instead of aluminum. The 20 mW transceiver fabricated in the 0.18 μm copper UMC process can achieve a 0.1% BER for a - 98 dBm input, while operating at 200 kb/s data. The maximum power output of transmit section is +10 dBm.
Original language | English (US) |
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Pages (from-to) | 2813-2817 |
Number of pages | 5 |
Journal | IEEE Vehicular Technology Conference |
Volume | 4 |
Issue number | 53ND |
State | Published - Jan 1 2001 |
Event | IEEE VTS 53rd Vehicular Technology Conference (VTS SPRING 2001) - Rhodes, Greece Duration: May 6 2001 → May 9 2001 |