An iterative approach to measuring two-dimensional gradient-index profiles based on external measurements of laser beam deflection

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

We present a numerical method for retrieving the refractive index distribution in two-dimensional gradient-index media from external measurements of laser beam deflection. Using an iterative approach to ascertain the boundary positions and angles of probe beams that transit the optical medium and constructing approximate beam trajectories that satisfy these boundary values, we show that the inverse problem can be reduced to the inversion of a sparse linear algebraic system. The beam trajectories are subsequently corrected using an iterative ray trace procedure that continually refines the computed solution and the associated boundary values. We demonstrate our method in simulation by calculating the refractive index distribution of a hypothetical 2-D gradient-index element from computer-generated external beam deflection data, where RMS index errors below 1% of the index range (nmax'nmin) are achieved.

Original languageEnglish (US)
Title of host publicationApplied Advanced Optical Metrology Solutions
EditorsJames D. Trolinger, Erik Novak, Erik Novak, James D. Trolinger
PublisherSPIE
ISBN (Electronic)9781628417425, 9781628417425
ISBN (Print)9781628417425, 9781628417425
DOIs
StatePublished - 2015
EventApplied Advanced Optical Metrology Solutions - San Diego, United States
Duration: Aug 10 2015Aug 12 2015

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9576
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceApplied Advanced Optical Metrology Solutions
Country/TerritoryUnited States
CitySan Diego
Period8/10/158/12/15

Bibliographical note

Publisher Copyright:
© COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.

Keywords

  • deflectometry
  • gradient-index
  • inhomogeneous media
  • metrology

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