Abstract
In addition to the traditional problems associated with testing ICs, analog circuit test is very susceptible to measurement induced errors. Precise calibration and signal matching are necessary to minimize these errors. These constraints increase the complexity and cost of analog circuit testers. In this paper, we introduce analog circuit observer blocks (ACOBs). ACOBs are designed to simplify test result observation in analog and mixed-signal ICs. Measurement errors are minimized since ACOBs are better matched to the circuits being tested and impose a lower load as well. If successful, they can reduce tester complexity. We present designs for ACOBs for a fully differential operational amplifier and a pipelined A/D converter.
| Original language | English (US) |
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| Pages | 258-263 |
| Number of pages | 6 |
| State | Published - Dec 1 1994 |
| Event | Proceedings of the 12th IEEE VLSI Test Symposium - Cherry Hill, NJ, USA Duration: Apr 25 1994 → Apr 28 1994 |
Other
| Other | Proceedings of the 12th IEEE VLSI Test Symposium |
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| City | Cherry Hill, NJ, USA |
| Period | 4/25/94 → 4/28/94 |