Analog and mixed-signal integrated circuits (IC's) are rapidly becoming more complex. In addition to the traditional problems associated with testing IC's, such as limited controllability and observability, analog and mixed-signal test is vulnerable to measurement induced errors. Constraints on measuring analog signals significantly increase the complexity and cost of testers for such circuits. In this paper, we introduce a design for test technique for analog and mixed-signal circuits, analog circuit observer blocks (ACOB's). ACOB's are structures designed to reduce the need for precision in measuring analog signals during circuit test. The primary technique used is that of encoding the data in the circuit (only during the test phase). ACOB's potentially offer a number of advantages over conventional offchip test techniques such as reduced tester complexity, smaller measurement induced errors and increased observability. ACOB schemes will necessarily have to be tailored to the type of circuit targeted. We present two ACOB schemes, one for the class of fully differential circuits, the second for pipelined analog-to-digital converters. In both cases, the ACOB schemes are shown to offer substantial benefits.
|Original language||English (US)|
|Number of pages||10|
|Journal||IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing|
|State||Published - 1997|
Bibliographical noteFunding Information:
Manuscript received June 20, 1994; revised September 28, 1995. This work was supported in part by a Grant from NST MIP 9501499. This paper was recommended by Associate Editor M. Soma. The authors are with the Department of Electrical Engineering, University of Minnesota, Minneapolis, MN 55455 USA. Publisher Item Identifier S 1057-7130(97)01687-X.
Dr. Vinnakota received the Career award from the National Science Foundation in 1995.
Copyright 2011 Elsevier B.V., All rights reserved.
- Analog test, code-based test, design for test, 1c test, mixed-signal test