X-ray micro computed tomography and image analysis provides a novel, non-destructive method to visualize and characterize the pore structure of complex materials such as paper and board. Comparison of Z-directional structural details of hand sheet and commercially made fine paper samples show a distinct difference in pore size distribution both in the in-plane and transverse direction. Commercial sheets show significant variation through the thickness direction potentially owing to the non-uniformity during formation. Method presented here may provide a useful tool to the papermaker to truly engineer the structure of paper and board tailored to specific end-use applications.
|Original language||English (US)|
|Number of pages||4|
|State||Published - Nov 20 2003|
|Event||2003 International Paper Physics Conference - Victoria, BC, Canada|
Duration: Sep 7 2003 → Sep 11 2003
|Other||2003 International Paper Physics Conference|
|Period||9/7/03 → 9/11/03|