Analytical STEM study of P-doped silicon nanocrystals exhibiting mid-infrared localized surface plasmon resonance

Research output: Contribution to journal › Comment/debate › peer-review

Original language	English (US)
Pages (from-to)	1508
Number of pages	1
Journal	Microscopy and Microanalysis
Volume	19
DOIs	https://doi.org/10.1017/S1431927613009537
State	Published - 2013

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@article{1036720ae0484c0f8f2b4b649d50e6d5,

title = "Analytical STEM study of P-doped silicon nanocrystals exhibiting mid-infrared localized surface plasmon resonance",

author = "Jeong, {J. S.} and Rowe, {D. J.} and Kortshagen, {U. R.} and Mkhoyan, {K. A.}",

year = "2013",

doi = "10.1017/S1431927613009537",

language = "English (US)",

volume = "19",

pages = "1508",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

}

TY - JOUR

T1 - Analytical STEM study of P-doped silicon nanocrystals exhibiting mid-infrared localized surface plasmon resonance

AU - Jeong, J. S.

AU - Rowe, D. J.

AU - Kortshagen, U. R.

AU - Mkhoyan, K. A.

PY - 2013

Y1 - 2013

UR - http://www.scopus.com/inward/record.url?scp=84962881536&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84962881536&partnerID=8YFLogxK

U2 - 10.1017/S1431927613009537

DO - 10.1017/S1431927613009537

M3 - Comment/debate

AN - SCOPUS:84962881536

SN - 1431-9276

VL - 19

SP - 1508

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -