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Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications
Greg Haugstad
Characterization Facility
Research output
:
Book/Report
›
Book
158
Scopus citations
Overview
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Dive into the research topics of 'Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications'. Together they form a unique fingerprint.
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Chemical Compounds
Atomic Force Microscopy
100%
Force
85%
Tribology
84%
Application
39%
Surface
20%