Automatic test pattern generation on multiprocessors: A summary of results

Sunil Arvindam, Vipin Kumar, V. Nageshwara Rao, Vineet Singh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Fingerprint

Dive into the research topics of 'Automatic test pattern generation on multiprocessors: A summary of results'. Together they form a unique fingerprint.

Mathematics

Engineering & Materials Science