Biaxiality and temperature dependence of 3- and 4-layer intermediate smectic-phase structures as revealed by resonant X-ray scattering

N. W. Roberts, S. Jaradat, L. S. Hirst, M. S. Thurlow, Y. Wang, S. T. Wang, Z. Q. Liu, C. C. Huang, J. Bai, R. Pindak, H. F. Gleeson

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