Border trap characterization in metal-oxide-graphene capacitors with HfO2 dielectrics

Mona A. Ebrish, David A. Deen, Steven J. Koester

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations
Original languageEnglish (US)
Title of host publication71st Device Research Conference, DRC 2013 - Conference Digest
Pages37-38
Number of pages2
DOIs
StatePublished - Dec 16 2013
Event71st Device Research Conference, DRC 2013 - Notre Dame, IN, United States
Duration: Jun 23 2013Jun 26 2013

Other

Other71st Device Research Conference, DRC 2013
Country/TerritoryUnited States
CityNotre Dame, IN
Period6/23/136/26/13

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