Cadmium zinc telluride substrate growth, characterization, and evaluation

M. Kestigian, A. B. Bollong, J. J. Derby, H. L. Glass, K. Harris, L. Hettich, P. K. Liao, P. Mitra, P. W. Norton, H. Wadley

Research output: Contribution to journalConference articlepeer-review

14 Scopus citations

Abstract

Cadmium zinc telluride substrates were grown by the vertical and horizontal Bridgman techniques, characterized, and evaluated. Evaluation included the fabrication and testing of infrared focal plane arrays. Correlations of substrate defects and FPA performance were made.

Original languageEnglish (US)
Pages (from-to)726-731
Number of pages6
JournalJournal of Electronic Materials
Volume28
Issue number6
DOIs
StatePublished - 1999
Externally publishedYes
EventProceedings of the 1998 U.S. Workshop on the Physics and Chmeistry of II-VI Materials - Charleston, SC, USA
Duration: Oct 20 1998Oct 22 1998

Bibliographical note

Funding Information:
This work sponsored by DARPA/CMO under contract MDA 972-91-C-0046. Mr. Raymond Balcerak was the contract monitor. Johnson Matthey was the prime contractor and the Program Manager was Duane M. Fletcher. Distribution Statement “A”, Approved for Public Release, Distribution Unlimited.

Copyright:
Copyright 2018 Elsevier B.V., All rights reserved.

Fingerprint

Dive into the research topics of 'Cadmium zinc telluride substrate growth, characterization, and evaluation'. Together they form a unique fingerprint.

Cite this