CHARACTERIZATION OF CMOS LATCH-UP.

C. C. Huang, M. D. Hartranft, N. F. Pu, C. Yue, C. Rahn, J. Schrankler, G. D. Kirchner, F. L. Hampton, T. E. Hendrickson

Research output: Contribution to journal › Conference article › peer-review

15 Scopus citations

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