Characterization of electrical properties of polymers for conductive nano-composites

Oliver K. Johnson, Daniel Seegmiller, David T. Fullwood, Andrew Dattelbaum, Nathan A. Mara, George Kaschner, Thomas Mason, John D. Yeager

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Properties of various conductive nano-composites are dominated by quantum-level effects across small barriers created by the matrix material. The properties of the matrix clearly have a vital influence on the resultant behavior of the material. However, the quantification of the relevant matrix properties at the quantum level is difficult to measure using current techniques. This paper reports on recent work to simplify the process of characterizing the electrical properties of various polymers at this length scale using a nano-indenter with a conductive tip. A brief overview of the physical theory behind the technique is presented, along with preliminary experimental results. Though the technique shows significant sensitivity to data analysis procedures, the measured values agree reasonably well with those available in the literature. The methodology provides key insights into the behavior of conductive nanocomposites of various types.

Original languageEnglish (US)
Title of host publication2011 SAMPE Spring Technical Conference and Exhibition - State of the Industry
Subtitle of host publicationAdvanced Materials, Applications, and Processing Technology
StatePublished - 2011
Event2011 SAMPE Spring Technical Conference and Exhibition - State of the Industry: Advanced Materials, Applications, and Processing Technology - Long Beach, CA, United States
Duration: May 23 2011May 26 2011

Publication series

NameInternational SAMPE Technical Conference

Other

Other2011 SAMPE Spring Technical Conference and Exhibition - State of the Industry: Advanced Materials, Applications, and Processing Technology
CountryUnited States
CityLong Beach, CA
Period5/23/115/26/11

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