Properties of various conductive nano-composites are dominated by quantum-level effects across small barriers created by the matrix material. The properties of the matrix clearly have a vital influence on the resultant behavior of the material. However, the quantification of the relevant matrix properties at the quantum level is difficult to measure using current techniques. This paper reports on recent work to simplify the process of characterizing the electrical properties of various polymers at this length scale using a nano-indenter with a conductive tip. A brief overview of the physical theory behind the technique is presented, along with preliminary experimental results. Though the technique shows significant sensitivity to data analysis procedures, the measured values agree reasonably well with those available in the literature. The methodology provides key insights into the behavior of conductive nanocomposites of various types.