Characterizing Electromigration Effects in a 16nm FinFET Process Using a Circuit Based Test Vehicle

N. Pande, C. Zhou, M. H. Lin, R. Fung, R. Wong, S. Wen, C. H. Kim

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

8 Scopus citations

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Engineering & Materials Science

Physics & Astronomy

Chemical Compounds