Circuit models for constant impedance micromachined lines on dielectric transitions

S. Riki Banerjee; Rhonda Franklin Drayton

doi:10.1109/TMTT.2003.821253

Circuit models for constant impedance micromachined lines on dielectric transitions

S. Riki Banerjee, Rhonda Franklin Drayton

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

Constant impedance microstrip lines printed across nonuniform thickness substrates are studied. Accurate LC models are described to predict the discontinuity effect for dielectric step changes greater than 200 μm at the boundary interface. A variety of step or taper transition combinations in the conductor and dielectric are considered. When compared to full-wave simulations, the successfully modeled designs have return and insertion losses within 3 and 0.33 dB, respectively.

Original language	English (US)
Pages (from-to)	105-111
Number of pages	7
Journal	IEEE Transactions on Microwave Theory and Techniques
Volume	52
Issue number	1 I
DOIs	https://doi.org/10.1109/TMTT.2003.821253
State	Published - Jan 2004

Keywords

Dielectric discontinuities
Micromachining
Microstrip
Substrate discontinuities

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access

10.1109/TMTT.2003.821253

OpenUrl availability

Full text

Cite this

@article{62c1df9390d54a71b2ec4d796ab1d5e1,

title = "Circuit models for constant impedance micromachined lines on dielectric transitions",

abstract = "Constant impedance microstrip lines printed across nonuniform thickness substrates are studied. Accurate LC models are described to predict the discontinuity effect for dielectric step changes greater than 200 μm at the boundary interface. A variety of step or taper transition combinations in the conductor and dielectric are considered. When compared to full-wave simulations, the successfully modeled designs have return and insertion losses within 3 and 0.33 dB, respectively.",

keywords = "Dielectric discontinuities, Micromachining, Microstrip, Substrate discontinuities",

author = "Banerjee, {S. Riki} and Drayton, {Rhonda Franklin}",

year = "2004",

month = jan,

doi = "10.1109/TMTT.2003.821253",

language = "English (US)",

volume = "52",

pages = "105--111",

journal = "IEEE Transactions on Microwave Theory and Techniques",

issn = "0018-9480",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "1 I",

}

TY - JOUR

T1 - Circuit models for constant impedance micromachined lines on dielectric transitions

AU - Banerjee, S. Riki

AU - Drayton, Rhonda Franklin

PY - 2004/1

Y1 - 2004/1

N2 - Constant impedance microstrip lines printed across nonuniform thickness substrates are studied. Accurate LC models are described to predict the discontinuity effect for dielectric step changes greater than 200 μm at the boundary interface. A variety of step or taper transition combinations in the conductor and dielectric are considered. When compared to full-wave simulations, the successfully modeled designs have return and insertion losses within 3 and 0.33 dB, respectively.

AB - Constant impedance microstrip lines printed across nonuniform thickness substrates are studied. Accurate LC models are described to predict the discontinuity effect for dielectric step changes greater than 200 μm at the boundary interface. A variety of step or taper transition combinations in the conductor and dielectric are considered. When compared to full-wave simulations, the successfully modeled designs have return and insertion losses within 3 and 0.33 dB, respectively.

KW - Dielectric discontinuities

KW - Micromachining

KW - Microstrip

KW - Substrate discontinuities

UR - http://www.scopus.com/inward/record.url?scp=1242308453&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=1242308453&partnerID=8YFLogxK

U2 - 10.1109/TMTT.2003.821253

DO - 10.1109/TMTT.2003.821253

M3 - Article

AN - SCOPUS:1242308453

SN - 0018-9480

VL - 52

SP - 105

EP - 111

JO - IEEE Transactions on Microwave Theory and Techniques

JF - IEEE Transactions on Microwave Theory and Techniques

IS - 1 I

ER -

Circuit models for constant impedance micromachined lines on dielectric transitions

Abstract

Keywords

UN SDGs

Access

OpenUrl availability

Other files and links

Fingerprint

Cite this