Abstract
A discussion is presented of the tradeoff criteria which must be considered for a reliable memory design including: (1) reliability criteria, (2) fault coverage criteria, and (3) implementation criteria, and provides sample tradeoff data which will allow the designer to evaluate these alternatives.
| Original language | English (US) |
|---|---|
| Pages | 170-174 |
| Number of pages | 5 |
| State | Published - Jan 1 1977 |
| Event | Dig Pap IEEE Comput Soc Int Conf 14th - San Francisco, CA, USA Duration: Feb 28 1977 → Mar 3 1977 |
Other
| Other | Dig Pap IEEE Comput Soc Int Conf 14th |
|---|---|
| City | San Francisco, CA, USA |
| Period | 2/28/77 → 3/3/77 |