Abstract
The Kurokawa-Schlosser quality factor Q is used to compare the GaAs MESFET switch with the GaAs p-i-n diode switch. The MESFET device parameters are governed by the power handling capability and the specified pinchoff voltage, and the switch Q is calculated from an approximate expression. The GaAs p-i-n has been characterized using a simple diode model which is derived from detailed simulations. The comparison for typical devices shows that the GaAs p-i-n has the higher Q and therefore should have improved characteristics as a switch in terms of insertion loss and isolation.
Original language | English (US) |
---|---|
Pages (from-to) | 505-506 |
Number of pages | 2 |
Journal | IEEE Electron Device Letters |
Volume | 6 |
Issue number | 10 |
DOIs | |
State | Published - Oct 1985 |