TY - GEN
T1 - Confidence scalable post-silicon statistical delay prediction under process variations
AU - Qunzeng, Liu
AU - Sapatnekar, Sachin S
PY - 2007
Y1 - 2007
N2 - Due to increased variability trends in nanoscale integrated circuits, statistical circuit analysis has become essential. We present a novel method for post-silicon analysis that gathers data from a small number of on-chip test structures, and combines this information with pre-silicon statistical timing analysis to obtain narrow, die-specific, timing PDFs. Experimental results show that for the benchmark suite being considered, taking all parameter variations into consideration, our approach can get a PDF with the standard deviation 83.5% smaller on average than the SSTA result. The approach is scalable to smaller test structure overheads.
AB - Due to increased variability trends in nanoscale integrated circuits, statistical circuit analysis has become essential. We present a novel method for post-silicon analysis that gathers data from a small number of on-chip test structures, and combines this information with pre-silicon statistical timing analysis to obtain narrow, die-specific, timing PDFs. Experimental results show that for the benchmark suite being considered, taking all parameter variations into consideration, our approach can get a PDF with the standard deviation 83.5% smaller on average than the SSTA result. The approach is scalable to smaller test structure overheads.
KW - Post-silicon optimization
KW - Statistical timing analysis
UR - http://www.scopus.com/inward/record.url?scp=34547322816&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=34547322816&partnerID=8YFLogxK
U2 - 10.1109/DAC.2007.375216
DO - 10.1109/DAC.2007.375216
M3 - Conference contribution
AN - SCOPUS:34547322816
SN - 1595936270
SN - 9781595936271
T3 - Proceedings - Design Automation Conference
SP - 497
EP - 502
BT - 2007 44th ACM/IEEE Design Automation Conference, DAC'07
T2 - 2007 44th ACM/IEEE Design Automation Conference, DAC'07
Y2 - 4 June 2007 through 8 June 2007
ER -