Control and systems approaches to atomic force microscopy

Pranav Agarwal; Murti V. Salapaka

doi:10.3182/20080706-5-KR-1001.3717

Control and systems approaches to atomic force microscopy

Pranav Agarwal, Murti V. Salapaka

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

The atomic force microscope (AFM) and its derivative technologies have heralded a new era in science and technology. AFM and related instruments were primarily designed by physicists. In recent years there is a substantial presence of engineers with controls and systems background who are contributing to AFM related technologies. This article provides a tutorial on the control and systems approaches to AFM. This paper also delineates the impact controls and systems perspectives have on AFM related research and indicates future directions.

Original language	English (US)
Title of host publication	Proceedings of the 17th World Congress, International Federation of Automatic Control, IFAC
Edition	1 PART 1
DOIs	https://doi.org/10.3182/20080706-5-KR-1001.3717
State	Published - 2008
Event	17th World Congress, International Federation of Automatic Control, IFAC - Seoul, Korea, Republic of Duration: Jul 6 2008 → Jul 11 2008

Publication series

Name	IFAC Proceedings Volumes (IFAC-PapersOnline)
Number	1 PART 1
Volume	17
ISSN (Print)	1474-6670

Other

Other	17th World Congress, International Federation of Automatic Control, IFAC
Country/Territory	Korea, Republic of
City	Seoul
Period	7/6/08 → 7/11/08

Bibliographical note

Funding Information:
This work was supported in part by the National Science Foundation by the ECS and CMS divisions

Keywords

Identification and control methods
Microsystems: nano- and micro-technologies

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10.3182/20080706-5-KR-1001.3717

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Agarwal, P & Salapaka, MV 2008, Control and systems approaches to atomic force microscopy. in Proceedings of the 17th World Congress, International Federation of Automatic Control, IFAC. 1 PART 1 edn, IFAC Proceedings Volumes (IFAC-PapersOnline), no. 1 PART 1, vol. 17, 17th World Congress, International Federation of Automatic Control, IFAC, Seoul, Korea, Republic of, 7/6/08. https://doi.org/10.3182/20080706-5-KR-1001.3717

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Control and systems approaches to atomic force microscopy

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