Abstract
We have studied transients of luminescence due to free excitons and excitons trapped at oxygen vacancies in cuprous oxide. We find that both trapped and free paraexcitons have lifetime dependent on temperature and on the oxygen concentration. By using samples containing much less copper vacancies relative to oxygen vacancies, we find out the direct correlation between the free paraexciton lifetime and trapped exciton lifetime.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 524-527 |
| Number of pages | 4 |
| Journal | Journal of Luminescence |
| Volume | 134 |
| DOIs | |
| State | Published - Feb 1 2013 |
Keywords
- Defect levels
- Excitons
- Impurities