Coulomb drag in systems with tunneling bridges

Yuval Oreg, Alex Kamenev

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

We study the Coulomb drag effect in double layer electronic systems with local tunneling links. The possibility of tunneling between the layers leads to a pronounced exchange contribution to the transconductance, which is negative and nonvanishing at zero temperature. The diffusive motion of the electrons inside each layer in interplay with the electron-electron interaction causes a distinct singular temperature dependence of the transconductance at low temperatures.

Original languageEnglish (US)
Pages (from-to)2421-2424
Number of pages4
JournalPhysical Review Letters
Volume80
Issue number11
DOIs
StatePublished - Jan 1 1998
Externally publishedYes

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