Skip to main navigation
Skip to search
Skip to main content
Experts@Minnesota Home
Home
Profiles
Research units
University Assets
Projects and Grants
Research output
Press/Media
Datasets
Activities
Fellowships, Honors, and Prizes
Search by expertise, name or affiliation
Deflection beam-chopping in the SEM
A. Gopinath, M. S. Hill
Electrical and Computer Engineering
Research output
:
Contribution to journal
›
Article
›
peer-review
26
Scopus citations
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Deflection beam-chopping in the SEM'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Mathematics
Scanning Electron Microscope
100%
Deflection
63%
Lens
34%
Electrostatics
16%
Movement
13%
Angle
11%
Physics & Astronomy
deflection
49%
electron microscopes
43%
scanning
34%
apertures
31%
lenses
20%
cut-off
11%
electrostatics
10%
Engineering & Materials Science
Lenses
56%
Scanning
42%
Electrostatics
29%
Chemical Compounds
Electron Particle
29%