Abstract
Localized heating of metals and alloys using a focused laser beam in ambient atmosphere produces dielectric oxide layers that have characteristic optical appearances including different colors. Nanoindentation probed the deformation and fracture of laser-fabricated oxides on 304L stainless steel. Conductive nanoindentation measured electrical contact resistance (ECR) of the same colored oxides indicating a correlation between laser exposure, conductance during loading, current-voltage (I-V) behavior at constant load, and indentation response. Microscopy and X-ray diffraction examined the microstructure and chemical composition of the oxides. Combining techniques provides a unique approach for correlating mechanical behavior and the resulting performance of the films in conditions that cause wear.
Original language | English (US) |
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Title of host publication | Properties and Processes at the Nanoscale - Nanomechanics of Material Behavior |
Pages | 73-78 |
Number of pages | 6 |
DOIs | |
State | Published - 2012 |
Event | 2011 MRS Fall Meeting - Boston, MA, United States Duration: Nov 28 2011 → Dec 2 2011 |
Publication series
Name | Materials Research Society Symposium Proceedings |
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Volume | 1424 |
ISSN (Print) | 0272-9172 |
Other
Other | 2011 MRS Fall Meeting |
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Country/Territory | United States |
City | Boston, MA |
Period | 11/28/11 → 12/2/11 |
Bibliographical note
Funding Information:This work was supported by the Defense Threat Reduction Agency, Basic Research Award # IACRO 10-4257I, to Washington State University sub-contracted through Sandia National Laboratories, and NSF Grant NSF/DMR-0946337. Sandia National Laboratories is a multiprogram laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Company, for the United States Department of Energy’s National Nuclear Security Administration under contract DE-AC04-94AL85000. The authors would like to thank Paul Kotula, Mark Rodriguez, Vitalie Stavila, Ryan Nishimoto, Jeff Chames, and Ray Friddle for their work and helpful discussions on microscopy and XRD.