Deformation response of AgCu interfaces investigated by in situ and ex situ TEM straining and MD simulations

B. P. Eftink, A. Li, I. Szlufarska, N. A. Mara, I. M. Robertson

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20 Scopus citations

Abstract

The mechanisms of strain transfer across Ag/Cu interfaces were determined by a combination of in situ and ex situ TEM straining experiments and molecular dynamics simulations. Minimizing the magnitude of the Burgers vector of the residual dislocation generated in the interface was the dominant factor for determining the outcome of dislocation and deformation twin interactions with both non-coherent twin and cube-on-cube interfaces. This included the unexpected finding, due to the loading condition, of deformation twin activation in the Cu layer due to the intersection of deformation twins in Ag with the interface. Deformation twin nucleation in Ag from the non-coherent twin interfaces was also explained by a Burgers vector minimization argument.

Original languageEnglish (US)
Pages (from-to)212-223
Number of pages12
JournalActa Materialia
Volume138
DOIs
StatePublished - Oct 1 2017

Bibliographical note

Funding Information:
BPE and IMR acknowledge the contributions of Prof. O. Kingstedt and Prof. J. Lambros for providing the deformed samples and for many fruitful discussions. Dr. Doug Safarik is acknowledged for use of facilities at Los Alamos National Laboratory to produce the material for the experiments. The experimental work was performed, in part, at the University of Wisconsin Madison and was supported by the US Department of Energy Office of Basic Energy Sciences, Division of Materials Science, under award No. DEFG-02-07ER46443 (IMR and BPE). Simulation work was supported by the Army Research Office grant #W911NF-12-1-0548 (AL and IS). Instrument support was also provided by Materials Research Science and Engineering Center (DMR-1121288) and Nanoscale Science and Engineering Center (DMR-0832760) at University of Wisconsin-Madison.

Publisher Copyright:
© 2017

Keywords

  • Dislocations
  • Eutectic
  • In situ transmission electron microscopy (TEM)
  • Interfaces
  • MD simulations

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