Demonstration of a passive IC tamper sensor based on an exposed floating gate device in a standard logic process

Muqing Liu, Chris H. Kim

Research output: Contribution to journalArticlepeer-review

Abstract

We present an embedded Flash (eFlash) memory-based powerless nonvolatile tamper sensor for efficiently detecting counterfeit ICs. By exposing the floating gate (FG) node of a logic-compatible eFlash cell to the environment, the proposed sensor can record any subtle physical event that affects the charge stored on the exposed FG. The proposed sensor is demonstrated in both 65-nm and 0.35-μm standard CMOS technologies. Extensive test results confirm that suspicious activities such as temperature charge injection, humidity rises, and increased dust particle density in the cavity can be recorded powerlessly using the proposed sensor.

Original languageEnglish (US)
Article number8715737
Pages (from-to)2735-2740
Number of pages6
JournalIEEE Transactions on Electron Devices
Volume66
Issue number6
DOIs
StatePublished - Jun 2019

Bibliographical note

Publisher Copyright:
© 2019 IEEE.

Keywords

  • Counterfeit electronics
  • embedded Flash (eFlash)
  • floating gate (FG)
  • logic-compatible
  • physical attack
  • recycled chips

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