Design and fabrication of nanomagnetic majority logic gate based on spin hall assisted switching

A. K. Smith, M. Jamali, D. Hickox-Young, Z. Zhao, J. Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In recent years, spin-orbit torques induced by charge current in heavy metal/magnetic structures have attracted wide attention among researchers. Since the experimental demonstration of spin-orbit torques due to the spin Hall effect (SHE) being able to manipulate the magnetization direction in an in-plane MTJ structure[1], it has been heavily explored for applications in memory and logic. It provides a potential low power alternative to other techniques such as spin transfer torque or electric field control for magnetization reversal. Recently, it has been shown that the spin Hall effect can provide a clocking mechanism for logic applications where the spin Hall effect is used to change the magnetization of a perpendicularly magnetized device along the hard axis (in the plane of the film)[2]. In [2], a series of three nanomagets are spaced closely together so they interact through dipole interactions. Each nanomagnet serves as a logic bit. An additional nearby magnet is used as the input. However, due to the dipole interactions, only logic states of 101 or 010 can be obtained. For logic applications, it would be beneficial to be able to individually control the states of the individual bits to obtain a full range of logic functions.

Original languageEnglish (US)
Title of host publication2015 IEEE International Magnetics Conference, INTERMAG 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479973224
DOIs
StatePublished - Jul 14 2015
Event2015 IEEE International Magnetics Conference, INTERMAG 2015 - Beijing, China
Duration: May 11 2015May 15 2015

Publication series

Name2015 IEEE International Magnetics Conference, INTERMAG 2015

Other

Other2015 IEEE International Magnetics Conference, INTERMAG 2015
Country/TerritoryChina
CityBeijing
Period5/11/155/15/15

Bibliographical note

Publisher Copyright:
© 2015 IEEE.

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