Design fault directed test generation for microprocessor validation

Deepak A. Mathaikutty, Sandeep K. Shukla, Sreekumar V. Kodakara, David Lilja, Ajit Dingankar

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Scopus citations

Abstract

Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher potential to find faults in the design. We propose a model based test generation framework that generates tests for design fault classes inspired from software validation. There are two main contributions in this paper. Firstly, we propose a microprocessor modeling and test generation framework that generates test suites to satisfy Modified Condition Decision Coverage (MCDC), a structural coverage metric that detects most of the classified design faults as well as the remaining faults not covered by MCDC. Secondly, we show that there exists good correlation between types of design faults proposed by software validation and the errors/bugs reported in case studies on microprocessor validation. We demonstrate the framework by modeling and generating tests for the microarchitecture of VESPA, a 32-bit microprocessor. In the results section, we show that the tests generated using our framework's coverage directed approach detects the fault classes with 100% coverage, when compared to model-random test generation.

Original languageEnglish (US)
Title of host publicationProceedings - 2007 Design, Automation and Test in Europe Conference and Exhibition, DATE 2007
Pages761-766
Number of pages6
DOIs
StatePublished - 2007
Event2007 Design, Automation and Test in Europe Conference and Exhibition - Nice Acropolis, France
Duration: Apr 16 2007Apr 20 2007

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
ISSN (Print)1530-1591

Other

Other2007 Design, Automation and Test in Europe Conference and Exhibition
CountryFrance
CityNice Acropolis
Period4/16/074/20/07

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