Detection and repair of radiation induced single event upsets in an FPGA-based readout for TES bolometer arrays

Graeme Smecher, François Aubin, Oleg Djazovski, Matt Dobbs, Gordon Faulkner, Fabio Gulino, Peter O. Hyland, Kevin MacDermid, Neil Rowlands

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

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