Abstract
A high resolution null-transmission ellipsometry system has been developed for measurement of the optical properties of liquid crystal free-standing films. The ellipsometric parameters are measured to within a resolution of 0.002° from samples held in a sealed, temperature-controlled environment. By measuring the ellipsometric parameters as a function of applied electric field orientation, the optical symmetry and molecular orientations of free-standing liquid crystal films can be determined in some cases. Three carefully selected applications of this technique are presented.
Original language | English (US) |
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Pages (from-to) | 1521-1528 |
Number of pages | 8 |
Journal | Liquid Crystals |
Volume | 29 |
Issue number | 12 |
DOIs | |
State | Published - Dec 1 2002 |