Development and characterization of a new 1BL.1RS translocation line with resistance to stripe rust and powdery mildew of wheat

Tianheng Ren, Zu Jun Yang, Ben Ju Yan, Huai Qiong Zhang, Shu Lan Fu, Zheng Long Ren

Research output: Contribution to journalArticlepeer-review

50 Scopus citations

Abstract

The 1BL.1RS wheat-rye translocation from Petkus rye has contributed substantially to the world wheat production. However, following the breakdown of disease resistance genes in 1RS, its importance for wheat improvement decreased. We have developed a new 1BL.1RS line, R14, by means of crossing rye inbred line L155, selected from Petkus rye to several wheat cultivars. One new gene each, for stripe rust and powdery mildew resistance, located on 1RS of the line R14, are tentatively named YrCn17 and PmCn17. YrCn17 and PmCn17 confer resistance to Puccinia striiformis f. sp. tritici pathotypes that are virulent on Yr9, and Blumeria graminis f. sp. tritici pathotypes virulent on Pm8. These two new resistances, YrCn17 and PmCn17, are now available for wheat improvement programs. The present study indicates that rye cultivars may carry yet untapped variations as potential sources of resistance.

Original languageEnglish (US)
Pages (from-to)207-213
Number of pages7
JournalEuphytica
Volume169
Issue number2
DOIs
StatePublished - Apr 8 2009

Keywords

  • Blumeria graminis f. sp. tritici
  • Genetic diversity
  • Puccinia striiformis f. sp. tritici
  • Wheat breeding

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