Deviation analysis through model checking

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Scopus citations

Abstract

Inaccuracies, or deviations, in the measurements of monitored variables in a control system are facts of life that control software must accommodate - the software is expected to continue functioning correctly in the face of an expected range of deviations in the inputs. Deviation analysis can be used to determine how a software specification will behave in the face of such deviations in data from the environment. The idea is to describe the correct values of an environmental quantity; along with a range of potential deviations, and then determine the effects on the outputs of the system. The analyst can then check whether the behavior of the software is acceptable with respect to these deviations. In this report we wish to propose a new approach to deviation analysis using model checking techniques. This approach allows for more precise analysis than previous techniques, and refocuses deviation analysis from an exploratory analysis to a verification task, allowing us to investigate a different range of questions regarding a system's response to deviations.

Original languageEnglish (US)
Title of host publicationProceedings - ASE 2002
Subtitle of host publication17th IEEE International Conference on Automated Software Engineering
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages37-46
Number of pages10
ISBN (Electronic)0769517366, 9780769517360
DOIs
StatePublished - 2002
Event17th IEEE International Conference on Automated Software Engineering, ASE 2002 - Edinburgh, United Kingdom
Duration: Sep 23 2002Sep 27 2002

Publication series

NameProceedings - ASE 2002: 17th IEEE International Conference on Automated Software Engineering

Other

Other17th IEEE International Conference on Automated Software Engineering, ASE 2002
Country/TerritoryUnited Kingdom
CityEdinburgh
Period9/23/029/27/02

Bibliographical note

Funding Information:
This work has been partially supported by NASA grant NAG-1-224 and NASA contract NCC-01-001.

Publisher Copyright:
© 2002 IEEE.

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